碳材料由于其结构多样性，导致其性能多样化，因而应用领域广阔，碳材料研究已受到全球材料科学界、物理学界、化学界的广泛关注。本书系统介绍了碳材料表征技术及应用。包括X射线粉末衍射、小角X射线散射、透射电镜、扫描电子显微镜、图像分析、拉曼光谱、X射线光电子能谱、磁电阻、电化学性能、气体吸附/解吸等温线、热分析、表面官能团滴定测定、程序升温脱附技术。本书读者对象为材料领域的科技人员、研究生和高校教师。本书以英文著述，并与Elsevier出版集团合作，已在海外出版。
Michio Inagaki教授，日本北海道大学荣休教授。担任过日本碳素学会主席，JSPS117委员会主席，Carbon杂志副主编。获得过美国和中国碳素学会、日本陶瓷学会学术贡献奖。出版8本书，发表700多篇学术论文。Feiyu Kang（康飞宇），教授，清华大学深圳研究生院院长。现任SCI刊物《Carbon》顾问编委，SCI刊物《新型炭材料》副主编，层间化合物系列国际会议（ISIC）国际顾问委员会委员。曾获国家发明奖等多项奖励。出版中英文专著5部，在国内外发表论文200多篇。
List of Contributors.................................................................................
Preface ...............................................................................................
Acknowledgments ................................................................................
CHAPTER 1 Introduction............................................................ 1
Michio Inagaki, Feiyu Kang
1.1 Carbon Materials............................................................... 1
1.2 Characterization of Carbon Materials.................................... 3
1.3 Structure of the Present Book.............................................. 5
References.............................................................................. 6
CHAPTER 2 X-ray Powder Diffraction ......................................... 7
Norio Iwashita
2.1 Introduction...................................................................... 7
2.2 X-ray Diffraction Pattern of Carbon Materials........................ 8
2.3 Parameters Determined by X-ray Diffraction.........................10
2.4 Instrumentation ................................................................11
2.5 Specifications for Measurement ..........................................14
2.5.1 Preparation of Sample for X-ray Measurements............ 14
2.5.2 Measurement and Intensity Correction of Diffraction
Profiles.................................................................. 14
2.5.3 Correction of Diffraction Angle With Internal
Standard ................................................................ 16
2.5.4 Determination of Full Width at Half Maximum
Intensity ................................................................ 17
2.5.5 Accuracy of the Values Determined............................ 18
2.6 Degree of Graphitization ...................................................18
2.7 Key Issues for Measurement...............................................21
2.7.1 Diffraction Pattern................................................... 21
2.7.2 Use of Internal Standard........................................... 21
2.7.3 Use of Thin Sample Holder....................................... 22
2.7.4 Indexing the Diffraction Line .................................... 23
2.7.5 Separation into Component Profiles............................ 23
2.8 Concluding Remarks.........................................................24
References.............................................................................24
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